Driven by Moore's Law, integrated circuit technology has been continuously developing and entered into the era of sub-10 nm. With the introduction of various advanced manufacturing technologies such as high-k/metal gate and FinFET transistors, semiconductor devices are facing severe challenges from self-heating, fast transient traps and defects, and so on. These effects not only influence the performance of semiconductor devices but also have significant impacts on the reliability of devices and circuits. Therefore, it is crucial to focus on these issues during research and development.

        Currently, the clock frequency of chips has already far exceeded 1 GHz, which means the switching speed of logic devices and the data access speed of memory devices are both less than 1 nanosecond. There is an urgent need for sub-nanosecond-level electrical testing methods to obtain parameter measurement results that are more consistent to the actual circuit operations. This will enable precise device modeling and the release of process design kits. On the other hand, the reliability behavior of semiconductor devices under high-frequency AC stress in actual circuit operation significantly differs from that under DC stress. It is crucial to mimic the high-frequency stress in actual circuit operations using the ultra-fast semiconductor testing systems. This allows for the accurate assessment of reliability degradation, establishment of accurate models, and also obtaining a larger circuit design window.

        The Liryder team has dedicated many years to the research and development of ultra-fast electrical testing technology and system and collaborated with universities and research institutes. With this system, they have published dozens of related research papers and gained high recognition from peers both domestically and internationally. Liryder has developed the world's first ultra-fast sub-ns semiconductor parameter analyzer. The aim is to provide more accurate and realistic electrical measurement results for advanced process technologies and support the research and development of advanced integrated circuit technology. Moreover, this system is also suitable for novel logic and memory devices that require ultra-fast testing.